Ultra High Resolution 2, 500, 000X Nano Scale Field Emission Scanning Electron Microscope

• Customization: Available
• After-sales Service: 24h Online
• Warranty: 1 Year
• Model NO.: GD-TEST500
• Magnification: >1000X
• Type: Field Emission
• Mobility: Desktop
• Stereoscopic Effect: 3D
• Kind of Light Source: Infrared
• Usage: Research
• Principle: Electronic
• Transport Package: Wooden Case
• Trademark: Gold
• Origin: China
• HS Code: 9012100000
• Production Capacity: 10 Sets/Month

Product Description

Product Description

 

GD-TEST500 Filed Emission Scanning Electron Microscope

  Electrons from the field-emitting cathode are accelerated by a voltage of 20-35kV, then it will be ejected from the anode hole, forming a crossed beam of electrons. The electron beam will be irradiated onto the surface of the analyzed specimen in a raster-like scanning manner. The secondary and backscattered electrons generated by the interaction between the incident electrons and the surface material of the specimen will be used to obtain information on the surface microstructure and morphology of the specimen.
  Equipped with a wave spectrometer and an energy spectrometer, the generated X-rays are used for qualitative and quantitative chemical composition analysis of the specimen. It is used to examine and analyze the microstructural characteristics of solids, allowing high image resolution to be obtained.
  

Features & Application

Features:
* High resolution(1.2nm@1kV) imaging at low accelerating voltage
* Electromagnetic complex mirrors that reduce aberrations, significantly improve resolution at low voltages, and allow observation of magnetic samples
* Adopt high-voltage tunneling technology (SuperTunnel), where the electrons in the tunnel are kept at a high energy level, reducing space charge effects and ensuring low voltage resolution
* Electronic optical path without cross, effectively reduce the system aberration, enhance the resolving power
* Water-cooled thermostatic objective lens, to ensure the stability, reliability and repeatability of the objective lens work
* Magnetically deflected six-aperture adjustable diaphragm, automatic switching of diaphragm aperture, no mechanical adjustment, to realize high-resolution observation or large-beam flow analysis mode fast switching

Application:
* Observe and analyze surface morphology and structural characteristics of materials, including metallic materials, semiconductor materials, ceramic materials, etc
* Observe the structural morphology of biological samples, such as the morphological characteristics of cells, organelles, and nuclei. Provide strong support for the study of basic theories of biology and the diagnosis of diseases
* The morphology and composition of biomaterial surfaces provide important reference information for disease diagnosis, drug development and treatment
* Observation and study of morphology, structure and properties of nanomaterials
* Observing and analyzing the microstructure and composition of geological samples such as rocks and minerals

Cases

Technical Specifications

GD-TEST 500 Field Emission Scanning Electron Microscope Specification
No.	Item	Parameter
1	Resolution	0.8nm @ 15 kV,SE
2		0.7nm @ 15 kV (deceleration mode)
3		1.2nm @ 1.0 kV,SE
4		0.7nm @ 35 kV STEM
5	Acceleration Voltage	20 V ~ 30 kV
6	Magnification Rate	1-2,500,000 x
7	E-gun	Schottky field emission electron gun
8	Camera	Dual(Optical navigation + monitoring in the sample compartment)
9	Stroke of sample stage	X: 110 mm,Y: 110 mm,Z: 50 mm
10		T: -10°~+70°, R: 360°
11	Software	SEM
12	Operation System	WINDOWS
13	Auto funtion	Auto brightness contrast, auto focus, auto dispersion