Customization: | Available |
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After-sales Service: | Yes |
Warranty: | 1 Year |
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Pile Dynamic Load Testing Equipment Pile Load Capacity Testing Instrument Deep Foundation Bearing Capacity Testing Load Testing Piles Driving Analyzer
In the high strain method, a vertical transient impact load is applied to the pile top by the hammering system. The force acting on the pile top is close to the actual stress level of the pile, resulting in significant acceleration and inertia force. The strain of the pile body is equivalent to the strain level of the engineering pile. The impact force causes relative displacement between the pile and soil, so as to give full play to the pile side friction and stimulate the end resistance accordingly, Force and acceleration sensors are symmetrically installed on both sides of the pile at a certain distance from the pile top to measure the force and the response signal of the pile-soil system. The hammer response signal (pile strain stress curve and pile particle motion speed curve) is received through the foundation pile dynamic tester. Its dynamic response signal not only reflects the pile-soil characteristics, but also is closely related to the dynamic load intensity, spectrum composition and duration, Thus, the bearing capacity of single pile and the structural integrity of pile body are calculated and analyzed.
Technical Features
The first in the industry, with one - body screen. Visible in sunlight with better effect than new phones. Currently the industry's Only one of its kind.
Adopt full superimposed display method. More image observation of signal consistency, stability.
Low strain RS mode, PIT mode same machine operation.
Velocity, displacement, stress, velocity displacement, Case curve, split screen display, can clearly see each channel signal change.
Automatic implementation of click, hit, and monitor modes. Real-time monitoring of strain transducer deformation.
Up to 110 hammers per minute pile monitoring.
Case method analysis and display of F-ZV curve and traveling wave curve can be realized on site.
Adopt 24-bit high-precision low-noise ADC, ADC built-in digital filter, high signal-to-noise ratio, high reliability and low noise.
Model | GD-PDT(B) High Strain |
Display method | 8.4-inch true-color LCD screen Resolution: 800×600 (adjustable backlight) |
Storage capacity | 16G electronic hard disk |
Master control system | Low power embedded system Basic frequency≥1GHz Memory: 512M |
Sampling interval | High strain: 10-500μs multi-level adjustable Low strain: 5-1000μs continuous adjustable |
Floating point magnification | 1~256 |
Recording length | 1k |
A/D conversion accuracy | 24-bit instantaneous floating point |
System noise voltage | <20μV |
Dynamic range | ≥100dB |
Data export method | USB |
Frequency bandwidth | 2~12000Hz |
Sensor bandwidth | 0.5~9000Hz |
Power supply mode | Removable lithium battery; desktop charger is supported Service life≥8h |
Operation mode | Touch screen |
Number of channels | High strain: four channels Low strain: one channel |